Mask Synthesis (RET & Mask Preparation)


The Calibre MDP product line completes the integrated flow from IC design to IC mask manufacturing. The new tool suite allows for seamless continuation of the data manipulations required for resolution enhancement techniques (RET), such as phase shift mask (PSM), scattering bars (SB) and optical and process correction (OPC) to the mask data format conversion in one batch run. Calibre’s unique hierarchical geometry processing includes functions like layer derivation, mirroring, scaling, rotation, planarization fill, global and selective sizing.  The flow concludes with the output of the most important mask writer formats for advanced mask-making in the subwavelength era, such as MEBES and Variable-Shaped-Beam (VSB) formats as well as GDSII.

Hierarchical mask rule checking (MRC) is supported as well as mask proximity correction (MPC). Easy to handle viewing tools allow for fast assessment of problem areas.


 


Our third generation OPC tool that expands the Calibre arsenal of resolution enhancement technology (RET) products for sub-65 nanometer (nm) process technologies.

SST On the Scene at SPIE 2007: DFM

Mentor Technology Viewpoint: RET/OPC

Mentor Technology Viewpoint: MDP

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