All Presentations are in PDF Format 
Reducing Program Risks While Achieving Advanced Performance Requirement
IESF Military & Aerospace 2008 - May 2008
Walden C. Rhines
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Transitioning to 45nm: What's Breaking?
Globalpress Electronics Summit - April 2008
Walden C. Rhines
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Ending Endless Verification
DVCon - February 2008
Walden C. Rhines
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Distruptive Methodologies, India's Opportunity
VLSI India - January 2008
Walden C. Rhines
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Multi-Nationalization of Product Development Process
IDT Egypt - December 2007
Walden C. Rhines
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Changing the Design Rules
ISOCC - October 2007
Walden C. Rhines
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Design for the Nanometer Age: New Challenges, New Opportunities
Asian EDA Tech Forum - August 2007
Walden C. Rhines
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Less of Moore
SRC Retreat - July 2007
Walden C. Rhines
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Trends in Business Structures and Models
SRC Retreat - July 2007
Walden C. Rhines
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System Approaches to Integration of Automotive Electronic Components
Integrated Electrical Solutions Forum - April 2007
Walden C. Rhines
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